CY74FCT16841T
CY74FCT162841T
Pin Description
Name
D
LE
OE
O
Data Inputs
Latch Enable Input (Active HIGH)
Output Enable Input (Active LOW)
Three-State Outputs
Description
D
H
L
X
X
Function Table
[1]
Inputs
LE
H
H
L
X
OE
L
L
L
H
Outputs
Q
H
L
Q
[2]
Z
Maximum Ratings
[3, 4]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature
...................................... 鈭?5擄C
to +125擄C
Ambient Temperature with
Power Applied
.................................................. 鈭?5擄C
to +125擄C
DC Input Voltage
.................................................鈭?.5V
to +7.0V
DC Output Voltage
..............................................鈭?.5V
to +7.0V
DC Output Current
(Maximum Sink Current/Pin)
...........................鈭?0
to +120 mA
Range
Industrial
Power Dissipation .......................................................... 1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Ambient
Temperature
鈭?0擄C
to +85擄C
V
CC
5V
鹵
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
IH
V
IL
V
H
V
IK
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
O
I
OFF
Description
Input HIGH Voltage
Input LOW Voltage
Input Hysteresis
[6]
Input Clamp Diode Voltage
Input HIGH Current
Input LOW Current
High Impedance Output
Current (Three-State Output pins)
High Impedance Output
Current (Three-State Output pins)
Short Circuit Current
[7]
Output Drive Current
[7]
Power-Off Disable
V
CC
=Min., I
IN
=鈭?8 mA
V
CC
=Max., V
I
=V
CC
V
CC
=Max., V
I
=GND
V
CC
=Max., V
OUT
=2.7V
V
CC
=Max., V
OUT
=0.5V
V
CC
=Max., V
OUT
=GND
V
CC
=Max., V
OUT
=2.5V
V
CC
=0V, V
OUT
鈮?.5V
[8]
鈭?0
鈭?0
鈭?40
Test Conditions
Logic HIGH Level
Logic LOW Level
100
鈭?.7
鈭?.2
鹵1
鹵1
鹵1
鹵1
鈭?00
鈭?80
鹵1
Min.
2.0
0.8
Typ.
[5]
Max.
Unit
V
V
mV
V
碌A(chǔ)
碌A(chǔ)
碌A(chǔ)
碌A(chǔ)
mA
mA
碌A(chǔ)
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don鈥檛 Care. Z = HIGH Impedance.
2. Output level before LE HIGH-to-LOW Transition.
3. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
5. Typical values are at V
CC
= 5.0V, T
A
= +25藲C ambient.
6. This parameter is speci鏗乪d but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately re鏗俥ct operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
8. Tested at +25藲C.
2
1
2
3
4
5
6
