K4F170411C, K4F160411C
K4F170412C, K4F160412C
TEST MODE CYCLE
Parameter
Random read or write cycle time
Read-modify-write cycle time
Access time from RAS
Access time from CAS
Access time from column address
RAS pulse width
CAS pulse width
RAS hold time
CAS hold time
Column address to RAS lead time
CAS to W delay time
RAS to W delay time
Column address to W delay time
CAS precharge to W delay time
Fast Page cycle time
Fast Page read-modify-write cycle time
RAS pulse width (Fast Page cycle)
Access time from CAS precharge
OE access time
OE to data delay
OE command hold time
Symbol
Min
-50
Max
Min
115
160
55
18
30
55
18
18
55
30
41
78
53
58
40
81
55
200K
35
18
18
18
20
20
10K
10K
65
20
20
65
35
45
90
60
65
45
90
65
200K
40
20
65
20
35
10K
10K
-60
Max
CMOS DRAM
( Note 11 )
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
3
7
7
7
3,4,10,12
3,4,5,12
3,10,12
Notes
t
RC
t
RWC
t
RAC
t
CAC
t
AA
t
RAS
t
CAS
t
RSH
t
CSH
t
RAL
t
CWD
t
RWD
t
AWD
t
CPWD
t
PC
t
PRWC
t
RASP
t
CPA
t
OEA
t
OED
t
OEH
95
138