DDR SDRAM 128Mb F-die (x4, x8)
DDR SDRAM
Parameter
Symbol
B3
A2
B0
A0
(DDR333@CL=2.5)) (DDR266@CL=2.0) (DDR266@CL=2.5)) (DDR200@CL=2.0))
Min
Max
-
-
0.55
0.4
18
(tWR/tCK)
+
(tRP/tCK)
0.6
0.4
20
(tWR/tCK)
+
(tRP/tCK)
Unit
Note
Min
tHP
-tQHS
tCLmin
or tCHmin
Max
-
-
0.75
0.6
Min
tHP
-tQHS
tCLmin
or tCHmin
0.4
20
(tWR/tCK)
+
(tRP/tCK)
Max
-
-
0.75
0.6
Min
tHP
-tQHS
tCLmin
or tCHmin
0.4
20
(tWR/tCK)
+
(tRP/tCK)
Max
-
-
0.8
0.6
ns
ns
ns
tCK
11
10, 11
11
2
Output DQS valid window
Clock half period
Data hold skew factor
DQS write postamble time
Active to Read with Auto precharge
command
Autoprecharge write recovery +
Precharge time
tQH
tHP
tQHS
tWPST
tRAP
tHP
-tQHS
tCLmin
or tCHmin
tDAL
tCK
13
AC Operating Test Conditions
(V
DD
=2.5V, V
DDQ
=2.5V, T
A
= 0 to 70擄C)
Parameter
Input reference voltage for Clock
Input signal maximum peak swing
Input signal minimum slew rate (for imput only)
Input slew rate (I/O pins)
Input Levels(V
IH
/V
IL
)
Input timing measurement reference level
Output timing measurement reference level
Output load condition
Value
0.5 * V
DDQ
1.5
0.5
0.5
V
REF
+0.31/V
REF
-0.31
V
REF
V
tt
See Load Circuit
Unit
V
V
V/ns
V/ns
V
V
V
Note
AC operating test conditions
V
tt
=0.5*V
DDQ
R
T
=50鈩?/div>
Output
Z0=50鈩?/div>
C
LOAD
=30pF
V
REF
=0.5*V
DDQ
Output Load Circuit (SSTL_2)
Rev. 1.1 May. 2004
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