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K4H280838F-TC/LB3 Datasheet

  • K4H280838F-TC/LB3

  • 128Mb F-die DDR SDRAM Specification

  • 23頁(yè)

  • SAMSUNG   SAMSUNG

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DDR SDRAM 128Mb F-die (x4, x8)
General Description
DDR SDRAM
8M x 4Bit x 4 Banks / 4M x 8Bit x 4 Banks Double Data Rate SDRAM
The K4H280438F / K4H280838F is 134,217,728 bits of double data rate synchronous DRAM organized as 4x 8,388,608 / 4x 4,194,304
words by 4/ 8bits, fabricated with SAMSUNG鈥瞫 high performance CMOS technology. Synchronous features with Data Strobe allow
extremely high performance up to 333Mb/s per pin. I/O transactions are possible on both edges of DQS. Range of operating frequen-
cies, programmable burst length and programmable latencies allow the device to be useful for a variety of high performance memory
system applications.
Absolute Maximum Ratings
Parameter
Voltage on any pin relative to V
SS
Voltage on V
DD
& V
DDQ
supply relative to V
SS
Storage temperature
Power dissipation
Short circuit current
Symbol
V
IN
, V
OUT
V
DD
, V
DDQ
T
STG
P
D
I
OS
Value
-0.5 ~ 3.6
-1.0 ~ 3.6
-55 ~ +150
1.5
50
Unit
V
V
擄C
W
mA
Note :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommend operation condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC Operating Conditions
Parameter
Recommended operating conditions(Voltage referenced to V
SS
=0V, T
A
=0 to 70擄C)
Symbol
V
DD
V
DDQ
V
REF
V
TT
V
IH
(DC)
V
IL
(DC)
V
IN
(DC)
V
ID
(DC)
VI(Ratio)
I
I
I
OZ
I
OH
I
OL
I
OH
I
OL
Min
2.3
2.3
0.49*VDDQ
V
REF
-0.04
V
REF
+0.15
-0.3
-0.3
0.36
0.71
-2
-5
-16.8
16.8
-9
9
Max
2.7
2.7
0.51*VDDQ
V
REF
+0.04
V
DDQ
+0.3
V
REF
-0.15
V
DDQ
+0.3
V
DDQ
+0.6
1.4
2
5
Unit
V
V
V
V
V
V
V
-
uA
uA
mA
mA
mA
mA
Note
Supply voltage(for device with a nominal V
DD
of 2.5V)
I/O Supply voltage
I/O Reference voltage
I/O Termination voltage(system)
Input logic high voltage
Input logic low voltage
Input Voltage Level, CK and CK inputs
Input Differential Voltage, CK and CK inputs
V-I Matching: Pullup to Pulldown Current Ratio
Input leakage current
Output leakage current
Output High Current(Normal strengh driver) ;V
OUT
= V
TT
+ 0.84V
Output High Current(Normal strengh driver) ;V
OUT
= V
TT
- 0.84V
Output High Current(Half strengh driver) ;V
OUT
= V
TT
+ 0.45V
Output High Current(Half strengh driver) ;V
OUT
= V
TT
- 0.45V
1
2
3
4
Note :
1.VREF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the dc level of same.
Peak-to peak noise on VREF may not exceed +/-2% of the dc value.
2. V
TT
is not applied directly to the device. V
TT
is a system supply for signal termination resistors, is expected to be set equal to
V
REF
, and must track variations in the DC level of V
REF
3. V
ID
is the magnitude of the difference between the input level on CK and the input level on CK.
4. The ratio of the pullup current to the pulldown current is specified for the same temperature and voltage, over the entire
temperature and voltage range, for device drain to source voltages from 0.25V to 1.0V. For a given output, it represents the
maximum difference between pullup and pulldown drivers due to process variation. The full variation in the ratio of the
maximum to minimum pullup and pulldown current will not exceed 1/7 for device drain to source voltages from 0.1 to 1.0.
Rev. 1.1 May. 2004

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