Absolute Maximum Ratings
(Notes 1, 3)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage, (V
CC
)
Bias Voltage, (V
BB
)
Input Voltage, (V
IN
)
Storage Temperature Range, (T
STG
)
Lead Temperature
(Soldering,
<
10 sec.)
ESD Tolerance, Human Body Model
+90V
+16V
0V to 6V
鈭?5藲C to +150藲C
300藲C
2 kV
Machine Model
250V
Operating Range
(Note 2)
V
CC
+60V to +85V
+8V to +15V
V
BB
+0V to +5V
V
IN
+15V to +75V
V
OUT
Case Temperature
鈭?0藲C to +115藲C
Do not operate the part without a heat sink.
Electrical Characteristics
(See
Figure 2
for Test Circuit)
Unless otherwise noted: V
CC
= +80V, V
BB
= +12V, V
IN
= +2.7 V
DC
, C
L
= 8 pF, Output = 40 V
PP
at 1 MHz, T
C
= 50藲C.
Symbol
I
CC
I
BB
V
OUT
A
V
鈭咥
V
LE
t
R
t
F
OS
Parameter
Supply Current
Bias Current
DC Output Voltage
DC Voltage Gain
Gain Matching
Linearity Error
Rise Time
Fall Time
Overshoot
Condition
Per Channel, No Input Signal, No
Output Load
All Three Channels
No AC Input Signal, V
IN
= 1.2V
No AC Input Signal
(Note 4), No AC Input Signal
(Notes 4, 5), No AC Input Signal
(Note 6), 10% to 90%
(Note 6), 90% to 10%
(Note 6)
62
鈭?2
LM2409
Min
Typ
8
12
65
鈭?4
1.0
8
9
11
1
68
鈭?6
dB
%
ns
ns
%
Max
Units
mA
mA
V
DC
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.
Note 2:
Operating ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and
test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may
change when the device is not operated under the listed test conditions.
Note 3:
All voltages are measured with respect to GND, unless otherwise specified.
Note 4:
Calculated value from Voltage Gain test on each channel.
Note 5:
Linearity Error is the variation in dc gain from V
IN
= 1.0V to V
IN
= 4.5V.
Note 6:
Input from signal generator: t
r
, t
f
<
1 ns.
AC Test Circuit
DS100838-3
Note:
8 pF load includes parasitic capacitance.
FIGURE 2. Test Circuit (One Channel)
Figure 2
shows a typical test circuit for evaluation of the LM2409. This circuit is designed to allow testing of the LM2409 in a 50鈩?/div>
environment without the use of an expensive FET probe. The 4950鈩?resistor at the output forms a 100:1 voltage divider when
connected to a 50鈩?load.
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