P R E L I M I N A R Y
AC CHARACTERISTICS
Read-only Operations Characteristics
Parameter
Symbols
JEDEC
t
AVAV
t
AVQV
t
ELQV
t
GLQV
t
EHQZ
t
GHQZ
t
AXQX
Standard
t
RC
t
ACC
t
CE
t
OE
t
DF
t
DF
t
OH
t
Ready
t
ELFL
t
ELFH
t
FLQZ
BYTE Switching Low to Output High Z
(Note 3)
Max
20
30
30
30
ns
Description
Read Cycle Time (Note 4)
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output High Z (Notes 3, 4)
Output Enable to Output High Z (Notes 3, 4)
Output Hold Time From Addresses, CE,
or OE, Whichever Occurs First
RESET Pin Low to Read Mode (Note 4)
CE to BYTE Switching Low or High
CE = V
IL
OE = V
IL
OE = V
IL
Max
Max
Max
Max
Min
Max
Max
70
30
20
20
0
20
5
90
35
20
20
0
20
5
120
50
30
30
0
20
5
150
55
35
35
0
20
5
ns
ns
ns
ns
ns
碌s
ns
Test Setup
Min
Max
Speed Options (Notes 1
and 2)
-70
70
70
-90
90
90
-120
120
120
-150
150
150
Unit
ns
ns
Notes:
1. Test Conditions (for -70 only):
Output Load: 1 TTL gate and 30 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
input and output voltage: 1.5 V
2. Test Conditions (for all others):
Output Load: 1 TTL gate and 100 pF
Input rise and fall times: 20 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference
level, input and output voltages:
0.8 V and 2.0 V
3. Output driver disable time.
4. Not 100% tested.
5.0 V
IN3064
or Equivalent
2.7 k鈩?/div>
Device
Under
Test
CL
6.2 k鈩?/div>
Diodes = IN3064
or Equivalent
Notes:
For -70: C
L
= 30 pF including jig capacitance
For all others: C
L
= 100 pF including jig capacitance
20375C-12
Figure 7.
Test Conditions
26
Am29F800T/Am29F800B
8/18/97
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