Preliminary Technical Data
TYPICAL APPLICATION CIRCUIT
The high channel count of the AD5378 makes it wellsuited to
applications requiring high levels of integration such as optical
and automatic test equipment (ATE) systems. Figure 22 shows
the AD5378 as it is used in an ATE system. Shown here is one
pin of a typical logic tester. It is apparent that a number of
discrete levels are required for the pin driver, active load circuit,
parametric measurement unit, comparators, and clamps.
AD5378
In addition to the DAC levels required in the ATE system
shown, drivers, loads, comparators, and parametric
measurement unit functions are also required. Analog Devices
provides solutions for all these functions.
DRIVEN SHIELD
DAC
CENTRAL PMU
ADC
GUARD AMP
V
CH
ADC
DAC
PPMU
DAC
DAC
TIMING DATA
MEMORY
DAC
TIMING
GENERATOR
DLL LOGIC
V
TERM
V
H
RELAYS
50
鈩?/div>
COAX
FORMATTER DE-SKEW
DRIVER
DAC
V
L
DAC
DAC
V
TH
COMPARE
MEMORY
FORMATTER DE-SKEW
COMP
DAC
ACTIVE LOAD
DAC
I
OL
ADC
V
TL
DAC
DEVICE POWER
SUPPLY
V
CL
GND SENSE
DUT
DAC
V
COM
DAC
Figure 22. Typical Application Circuit for Logic Tester
Rev. PrA | Page 27 of 28
05292-022
I
OH
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