Absolute Maximum Ratings鈥?/div>
V
DD
............................................................................................................................................................................. 7.0V
DC Voltage at TXD, RXD, V
REF
and V
S
.............................................................................................-0.3V to V
DD
+ 0.3V
DC Voltage at CANH, CANL (Note
1)..........................................................................................................
-42V to +42V
Transient Voltage on Pins 6 and 7 (Note
2).............................................................................................
-250V to +250V
Storage temperature ............................................................................................................................... -55擄C to +150擄C
Operating ambient temperature .............................................................................................................. -40擄C to +125擄C
Virtual Junction Temperature, T
VJ
(Note
3)
............................................................................................ -40擄C to +150擄C
Soldering temperature of leads (10 seconds) ....................................................................................................... +300擄C
ESD protection on CANH and CANL pins (Note
4)
................................................................................................... 6 kV
ESD protection on all other pins (Note
4)
.................................................................................................................. 4 kV
Note 1:
Short-circuit applied when TXD is high and low.
2:
In accordance with ISO-7637.
3:
In accordance with IEC 60747-1.
4:
Classification A: Human Body Model.
鈥?NOTICE:
Stresses above those listed under 鈥淢aximum ratings鈥?may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at those or any other conditions above those indicated in
the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods
may affect device reliability.
錚?/div>
2002 Microchip Technology Inc.
Preliminary
DS21667C-page 7
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