SLE 4432
SLE 4442
3.2.4 AC Characteristics
The AC characteristics refer to the timing diagrams in the following.
V
IHmin
and
V
ILmax
are reference
levels for measuring timing of signals.
Parameter
RST High to CLK Setup time
CLK Low to RST Hold time
RST High time (address reset)
RST Low to I/O Valid time
RST Low to CLK Setup time
CLK Frequency
CLK Rise time
CLK Fall time
CLK High time
CLK Low time
CLK Low to I/O Valid time
Reset time for Break
RST High to I/O Clear time
(Break)
I/O High time (Start Condition)
CLK High to I/O Hold time
I/O Low to CLK Hold time
(Start Condition)
I/O Setup to CLK High time
CLK Low to I/O Hold time
CLK High to I/O Clear time
(Stop Condition)
CLK Low to I/O Valid time
CLK Low to I/O Valid time
CLK Low to I/O Clear time
Erase time
Write time
Power on reset time
Symbol
min.
Limit Values
typ.
max.
碌s
碌s
50
2.5
4
7
50
1
1
9
9
2.5
5
2.5
10
4
4
1
1
4
2.5
2.5
2.5
2.5
2.5
100
碌s
碌s
碌s
kHz
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
碌s
ms
ms
碌s
4
4
20
Unit
Test Condition
t
10
t
11
t
12
t
13
t
14
f
CLK
t
R
t
F
t
15
t
16
t
17
t
18
t
19
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
ER
t
WR
t
POR
f
CLK
= 50 kHz
f
CLK
= 50 kHz
Note:
The listed characteristics are ensured over the operating range of the integrated circuit.
Typical characteristics specify mean values expected over the production spread. If not
otherwise specified, typical characteristics apply at
T
A
= 25 擄C and the given supply voltage.
Semiconductor Group
28